This unit can perform two different methods of calculating thickness measurement by utilizing the characteristics of both eddy current and magnetic induction. The testing performance is both non-destructive and extremely accurate.
This unit can perform two different methods of calculating thickness measurement by utilizing the characteristics of both eddy current and magnetic induction. The testing performance is both non-destructive and extremely accurate.
Discontinued!
This product has been discontinued and is no longer available.
This is the direct replacement:
The PHASE II PTG-3525 can perform two different methods of calculating thickness measurement by utilizing the characteristics of both eddy current and magnetic induction. Testing performance is both non-destructive and extremely accurate.
With this state of the art thickness gauge, you can easily detect the thickness of nonmagnetic coating on a magnetic substrate (ferrous) or an insulating coating on a non-magnetic conductive substrate (non-ferrous) utilizing our version that comes with 2-external probes.
Applications
Ideal for the following applications: Manufacturing, General Engineering, Commercial Inspection
Measuring Range | 0-1000 u m max. or 0-40 mils |
Resolution | 0.1um/0.01mils(0-99um) or 1um (over 100um) |
Guaranteed Tolerance | After one-point calibration: ± 1-3%n or 2um (whichever is greater) |
Display | 4 digits (digit height = 10mm/0.4") |
Minimum Measuring Area | 0.2" x 0.2" (5mm x 5mm) |
Minimum Substrate Thickness | Ferrous: 20 mils (0.5um), Non-ferrous: 2 mils (50u m) |
Calibration | Zero Calibration, Foil calibration |
Measuring Range | 0-1000 u m max. or 0-40 mils |
Resolution | 0.1um/0.01mils(0-99um) or 1um (over 100um) |
Guaranteed Tolerance | After one-point calibration: ± 1-3%n or 2um (whichever is greater) |
Display | 4 digits (digit height = 10mm/0.4") |
Minimum Measuring Area | 0.2" x 0.2" (5mm x 5mm) |
Minimum Substrate Thickness | Ferrous: 20 mils (0.5um), Non-ferrous: 2 mils (50u m) |
Calibration | Zero Calibration, Foil calibration |